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Аннотации (01.2016) : EFFECT OF GAS PRESSURE AND FILM THICKNESS ON THE OPTICAL CONSTANTS OF TRANSPARENT CONDUCTING OXIDE BASED ON ZINC OXIDE

EFFECT OF GAS PRESSURE AND FILM THICKNESS ON THE OPTICAL CONSTANTS OF TRANSPARENT CONDUCTING OXIDE BASED ON ZINC OXIDE

 

© 2016   M. M. Abd El-Raheem*,**;  A. K. Diab**; Abdullah Alhuthali*; Ateyyah M. Al-Baradi*

*   Faculty of science, Taif University, Taif 888, Saudi Arabia

** Faculty of science, Sohag University, Sohag 82524, Egypt

Corresponding author: M. M Abd El-Raheem

E-mail: elneh@yahoo.com

Thin films of aluminum zinc oxide are prepared using DC magnetron sputtering. It was found that changing the thickness of the film as well as the pressure of argon affect the transmittance, optical gap, width of the band tails of the localized state, refractive index, real and imaginary parts of the dielectric function. The real and imaginary parts of optical conductivity as well as volume and surface energy loss functions are investigated in the light of changing the thickness of the films and argon pressure.

Keywords: thin film, sputtering, optical energy gap, refractive index, optical conductivity.

OCIS codes: 170.5810

Submitted 11.03.2015

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