ITMO
ru/ ru

ISSN: 1023-5086

ru/

ISSN: 1023-5086

Scientific and technical

Opticheskii Zhurnal

A full-text English translation of the journal is published by Optica Publishing Group under the title “Journal of Optical Technology”

Article submission Подать статью
Больше информации Back

УДК: 535.317

Study of methods for discretizing a source when modelling a photolithographic image

For Russian citation (Opticheskii Zhurnal):

Иванова Т.В., Зуева Л.В. Исследование способов дискретизации источника при моделировании фотолитографического изображения // Оптический журнал. 2012. Т. 79. № 5. С. 48–52.

 

Ivanova T. V., Zueva L. V. Study of methods for discretizing a source when modelling a photolithographic image  [in Russian] // Opticheskii Zhurnal. 2012. V. 79. № 5. P. 48–52.

For citation (Journal of Optical Technology):
T. V. Ivanova and L. V. Zueva, "Study of methods for discretizing a source when modelling a photolithographic image," Journal of Optical Technology. 79(5), 295-298.
Abstract:

There are two methods for discretizing the source when the formation of a photolithographic image is modelled in terms of the Abbe model: This can be done using a rectangular grid with various discretization steps, or with radial placement of the points on a rectangular grid with various steps along a radius and along the arc length between the points. It is shown that the use of a radial distribution of the points significantly speeds up the computation process, with the modelling accuracy being mainly determined by the step along the radius.

Keywords:

photolithography, Abbe model, source sampling

OCIS codes: 110.1758, 110.2990, 110.1650, 110.3960, 110.5220

References:

1. T. Heil, P. Graupner, R. Garreis, R. Egger, M. Brotsack, J. Finders, and S. Hansen, “Predictive modeling of advanced illumination pupils used as imaging enhancement for low-k1 applications,” Proc. SPIE 5377, 344 (2004).
2. D. G. Flagello, B. Geh, R. Socha, P. Liu, Y. Cao, R. Stas, O. Natt, and J. Zimmermann, “Understanding illumination effects for control of optical proximity effects (OPE),” Proc. SPIE 6924, 69241U-1 (2008).
3. J. Zimmermann, P. Gr¨aupner, J. T. Neumann, D. Hellweg, D. J¨urgens, M. Patra, C. Hennerkes, M. Maul, B. Geh, A. Engelen, O. Noordman, M. Mulder, S. Park, and J. D. Vocht, “Generation of arbitrary freeform source shapes using advanced illumination systems in high-NA immersion scanners,” Proc. SPIE 7640, 764005 (2010).
4. M. Born and E. Wolf, Principles of Optics: Electromagnetic Theory of Propagation, Interference, and Diffraction of Light (Pergamon Press, Oxford, 1970; Nauka, Moscow, 1973).
5. H. H. Hopkins, “Image formation with coherent and partially coherent light,” Photograph. Sci. Eng. 21, 114 (1977).