УДК: 535.321, 535.32, 539.238
A spectrophotometric method for determination of the optical constants of materials
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Котликов Е.Н. Спектрофотометрический метод определения оптических констант материалов // Оптический журнал. 2016. Т. 83. № 2. С. 3–7.
Kotlikov E.N. A spectrophotometric method for determination of the optical constants of materials [in Russian] // Opticheskii Zhurnal. 2016. V. 83. № 2. P. 3–7.
E. N. Kotlikov, "A spectrophotometric method for determination of the optical constants of materials," Journal of Optical Technology. 83(2), 77-80 (2016). https://doi.org/10.1364/JOT.83.000077
We propose a method for determining the optical constants of materials used in transmission optics. This technique is based on correction of absorption spectra. The absorption A may be divided into two parts: AT describes the contribution of absorption to the transmission spectrum, and AR describes the contribution of absorption to the reflection spectrum. The AT and AR spectra used to correct the RT spectra were calculated using correction functions and the total absorption A. Correction removes absorption from the spectra, so that the existing methods for determining the refractive index n can be used. We obtain analytical expressions for the absorption coefficient α and assess the accuracy of the method; this assessment indicated that spectral correction enables n to be determined to a maximum accuracy of 0.0001. The method was tested on optical silicon near the 9-μm absorption band.
spectra, reflection, transmission, correction of spectra, refractive indices, absorption, silicon
Acknowledgements:This work was financially supported by the Russian Federation Ministry of Education and Science as part of a government task order.
OCIS codes: 300.0300
References:1. M. Born and E. Wolf, Principles of Optics: Electromagnetic Theory of Propagation, Interference, and Diffraction of Light (Pergamon, NY, 1970; Nauka, Moscow, 1970).
2. N. M. Nagibina, V. A. Moskalev, V. L. Polushkina, and V. L. Rudin, Applied Physical Optics (Vysshaya Shkola, Moscow, 2002).
3. D. Poelman and P. F. Smet, “Methods for the determination of the optical constants of thin films from single transmission measurements: a critical review,” J. Phys. D 36, 1850–1857 (2003).
4. L. Gao, F. Lemarchand, and M. Lequime, “Comparison of different dispersion models for single layer optical thin film index determination,” Thin Solid Films 520, 501–509 (2011).
5. E. N. Kotlikov and Yu. A. Novikova, “A study of Bax Mg1-xF 2 optical films,” Opt. Spectrosc. 117(3), 381–385 (2014) [Opt. Spektrosk. 117(3), 396–400 (2014)].
6. E. N. Kotlikov, V. A. Ivanov, and A. N. Tropin, “Film’s forming materials for THz spectral range purposes,” in Proceedings of the Progress in Electromagnetics Research Symposium (PIERS) (Cambridge, MA, 5–8 July, 2010), pp. 159–162.
7. E. N. Kotlikov, Yu. A. Novikova, and I. I. Kovalenko, “Film Manager software for synthesis and analysis of interference coatings,” Informats.-Upr. Sist. 3(76), 51–59 (2015).
8. M. J. Weber, Handbook of Optical Materials (CRC Press, NY, 2003).
9. N. I. Astaf’ev, I. M. Nesmelova, and E. A. Nesmelov, “Features of semiconductor materials as infrared optical media,” J. Opt. Technol. 75(9), 608–610 (2008) [Opt. Zh. 75(9), 90–93 (2008)].