УДК: 535.8, 537.9

Simulation analysis of atomic-force images of nanocrystal structures

Parfenov, P.S., Litvin, A.P., Ushakova, E.V., Kolesova, E.P., Fedorov, A.V., Baranov, A.V.

Publication in Journal of Optical Technology

For Russian citation (Opticheskii Zhurnal):

Парфенов П.С., Литвин А.П., Ушакова Е.В., Колесова Е.П., Федоров А.В., Баранов А.В. Анализ атомно-силовых изображений структур из нанокристаллов с помощью имитационного моделирования // Оптический журнал. 2016. Т. 83. № 3. С. 7–14.

Parfenov P.S., Litvin A.P., Ushakova E.V., Kolesova E.P., Fedorov A.V., Baranov A.V. Simulation analysis of atomic-force images of nanocrystal structures [in Russian] // Opticheskii Zhurnal. 2016. V. 83. № 3. P. 7–14.

For citation (Journal of Optical Technology):

P. S. Parfenov, A. P. Litvin, E. V. Ushakova, E. P. Kolesova, A. V. Fedorov, and A. V. Baranov, "Simulation analysis of atomic-force images of nanocrystal structures," Journal of Optical Technology. 83(3), 143-149 (2016). https://doi.org/10.1364/JOT.83.000143

Abstract:

We propose a technique for interpretation of atomic-force microscope images in the structural analysis of nanocrystals formed by precipitation from solution. This technique includes comparison with a simple model describing the random distribution of nanocrystals on a surface. The results obtained are compared to experimental data for purposes of determining the surface density of nanocrystals, both in the case where the nanocrystals are distributed in multiple layers to determine how the surface structure is organized and in the case where isolated nanocrystals are randomly distributed over the surface.

Keywords:

nanocrystals, atomic-force microscopy, random distribution, deconvolution

Acknowledgements:

This work was performed with the financial support of the Russian Federation Ministry of Education and Science (Government Task Order No. 3.109.2014/K).

OCIS codes: 180.5810, 120.6650

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