УДК: 538.958, 539.234

Study of thin-film heterostructures produced by laser deposition of a platinum and a lead zirconate titanate layer

Mavlyanov, R.K., Vinogradov, A.Y., Kalinin, D.A., Tolmachev, V.A.

Publication in Journal of Optical Technology

For Russian citation (Opticheskii Zhurnal):

Мавлянов Р.К., Виноградов А.Я., Калинин Д.А., Толмачёв В.А. Исследование тонкоплёночной гетероструктуры, получаемой с помощью лазерного напыления слоёв платины и цирконат-титаната свинца // Оптический журнал. 2016. Т. 83. № 7. С. 32–37.

Mavlyanov R.K., Vinogradov A.Ya., Kalinin D.A., Tolmachev V.A. Study of thin-film heterostructures produced by laser deposition of a platinum and a lead zirconate titanate layer [in Russian] // Opticheskii Zhurnal. 2016. V. 83. № 7. P. 32–37.

For citation (Journal of Optical Technology):

R. K. Mavlyanov, A. Ya. Vinogradov, D. A. Kalinin, and V. A. Tolmachev, "Study of thin-film heterostructures produced by laser deposition of a platinum and a lead zirconate titanate layer," Journal of Optical Technology. 83(7), 415-418 (2016). https://doi.org/10.1364/JOT.83.000415

Abstract:

We investigate the feasibility of using laser deposition to produce Pt and lead zirconate titanate layers. Optical microscopy, electron microscopy, and atomic-force microscopy of the lead zirconate titanate layer reveal surface roughness on these layers. The optical parameters of the resulting layers were studied by spectral ellipsometry, including the dispersion in the index of refraction and absorption coefficient of the Pt and lead zirconate titanate surface layer. X-ray crystallography indicates that the lead zirconate titanate layer produced has the classical (111) perovskite crystallographic orientation. Similar heterostructures are used as ferroelectric memory elements.

Keywords:

optical constants dispersion, laser deposition, spectral ellipsometry, lead zirconate titanate

Acknowledgements:

The authors thank Academician I. V. Grekhov for useful advice, Yu. A. Zharova for preparing the samples in advance of the microscopic studies and for useful discussion, N. A. Feoktistov for the AFM measurements, A. V. Nashchekin for assistance in obtaining the SEM images, and N. V. Zaı˘tseva for the X-ray crystallography.

OCIS codes: 310.6860, 240.2130

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