УДК: 535.231.233
Influence of the Narcissus effect on the results of the calibration of test stands for measuring the parameters of optoelectronic devices
Full text «Opticheskii Zhurnal»
Full text on elibrary.ru
Publication in Journal of Optical Technology
Алешко Е.И., Курт В.И., Мирханов Н.Г. Влияние «нарцисс-эффекта» на результаты калибровки стендов для измерения параметров оптико-электронных приборов // Оптический журнал. 2017. Т. 84. № 3. С. 49–52.
Aleshko E.I., Kurt V.I., Mirkhanov N.G. Influence of the Narcissus effect on the results of the calibration of test stands for measuring the parameters of optoelectronic devices [in Russian] // Opticheskii Zhurnal. 2017. V. 84. № 3. P. 49–52.
E. I. Aleshko, V. I. Kurt, and N. G. Mirkhanov, "Influence of the Narcissus effect on the results of the calibration of test stands for measuring the parameters of optoelectronic devices," Journal of Optical Technology. 84(3), 197-200 (2017). https://doi.org/10.1364/JOT.84.000197
A methodical approach to the evaluation of the influence of the Narcissus effect observed during the calibration of test stands and of monitoring and testing equipment used for determining the characteristics of optoelectronic devices has been examined. Numerical estimates of this influence are presented for some types of test objects used in test stands and monitoring and testing equipment.
stands for measuring the parameters of thermal imaging devices, monitoring and testing equipment for thermal imaging devices, test object, rereflection, Narcissus effect
OCIS codes: 120.3930, 120.3940
References:1. E. I. Aleshko, V. I. Kurt, and L. R. Rakhimova, “Calibrating differential collimator test stands with respect to the radiation-temperature difference,” J. Opt. Technol. 74(3), 159 (2007) [Opt. Zh. 74(3), 13 (2007)].
2. A. G. Bugaenko, “Apparatus for evaluating the characteristics of thermal-viewing systems,” J. Opt. Technol. 69(4), 234 (2002) [Opt. Zh. 69(4), 19–25 (2002)].
3. A. G. Bugaenko, Yu. P. Nikitin, and N. L. Panteleev, “Collimators for testing thermal vision sights,” J. Opt. Technol. 71(2), 90 (2004) [Opt. Zh. 71(2), 32 (2004)].
4. A. G. Bugaenko, Yu. M. Belyakov, V. P. Ivanov, V. I. Kurt, and N. N. Malivanov, Testing of Thermal Imaging Devices (Kazan State Technical University, Kazan, 2010).