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ISSN: 1023-5086

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ISSN: 1023-5086

Scientific and technical

Opticheskii Zhurnal

A full-text English translation of the journal is published by Optica Publishing Group under the title “Journal of Optical Technology”

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DOI: 10.17586/1023-5086-2019-86-05-57-60

УДК: 617.7 535.34

Automated system for finding flaws in optical components

For Russian citation (Opticheskii Zhurnal):

Бельков С.А., Воронич И.Н., Губкин А.С., Деркач В.Н., Деркач И.Н., Добиков А.В., Лащук В.О., Щеников В.А. Автоматизированная система поиска дефектов оптических деталей // Оптический журнал. 2019. Т. 86. № 5. С. 57–60. http://doi.org/10.17586/1023-5086-2019-86-05-57-60

 

Belkov S.A., Voronich I.N., Gubkin A.S., Derkach V.N., Derkach I.N., Dobikov A.V., Lashchuk V.O., Shchenikov V.A. Automated system for finding flaws in optical components [in Russian] // Opticheskii Zhurnal. 2019. V. 86. № 5. P. 57–60. http://doi.org/10.17586/1023-5086-2019-86-05-57-60

For citation (Journal of Optical Technology):

S. A. Bel’kov, I. N. Voronich, A. S. Gubkin, V. N. Derkach, I. N. Derkach, A. V. Dobikov, V. O. Lashchuk, and V. A. Shchenikov, "Automated system for finding flaws in optical components," Journal of Optical Technology. 86(5), 306-309 (2019). https://doi.org/10.1364/JOT.86.000306

Abstract:

The presence of flaws such as bubbles, stria, and scratches in glass degrades the optical strength of components and leads to intense light scattering, loss of radiation energy, and the appearance of amplitude and phase laser beam distortions, leading to the development of intensity oscillations. The system presented here for searching for defects in optical components operates in a semi-automatic mode and allows us to find various defects and determine their coordinates and dimensions. The characteristics of the system are as follows: the minimum size of a detectable defect is 30 μm, the absolute error in determining its coordinates is 200 μm, and the maximum error in measuring the size is 10%. In the process of certification of optical components, Schlieren or end illumination methods are used, and their combination is used in some cases.

Keywords:

flaws finding, Schlieren method, end illumination method, bubbles, stria

OCIS codes: 220.4840, 120.4290

References:

1. L. A. Vasiliev, Schlieren Methods (Nauka, Moscow, 1968).
2. D. Malakara, Optical Fabrication Control (Mashinostroenie, Moscow, 1985).
3. F. Rainer, “Mapping and inspection of damage and artifacts in largescale optics,” Proc. SPIE 3244, 272–281 (1997).
4. R. R. Prasad, M. Bernacil, J. Halpin, J. Peterson, S. Mills, and R. P. Hackel, “Design of an illumination technique to improve the identification of surface flaws on optics,” Proc. SPIE 5647, 421–426 (2005).