DOI: 10.17586/1023-5086-2019-86-08-36-43
УДК: 535.31:681
Measurement of optical characteristics of catadioptric retroreflectors
Full text «Opticheskii Zhurnal»
Full text on elibrary.ru
Publication in Journal of Optical Technology
Цветков А.Д., Босый О.Н., Пасункин В.Н., Потапов С.Л., Потапова Н.И. Измерение оптических характеристик катадиоптрических световозвращателей // Оптический журнал. 2019. Т. 86. № 8. С. 36–43. http://doi.org/10.17586/1023-5086-2019-86-08-36-43
Tsvetkov A.D., Bosiy O.N., Pasunkin V.N., Potapov S.L., Potapova N.I. Measurement of optical characteristics of catadioptric retroreflectors [in Russian] // Opticheskii Zhurnal. 2019. V. 86. № 8. P. 36–43. http://doi.org/10.17586/1023-5086-2019-86-08-36-43
A. D. Tsvetkov, O. N. Bosyĭ, V. N. Pasunkin, S. L. Potapov, and N. I. Potapova, "Measurement of optical characteristics of catadioptric retroreflectors," Journal of Optical Technology. 86(8), 486-492 (2019). https://doi.org/10.1364/JOT.86.000486
A technique for determining the effective scattering area of retroreflective catadioptric (reflective–refractive) devices is presented. An experimental setup for measuring the effective scattering area and comparative calculated and measurement data on the effect of fabrication errors on the characteristics of retroreflective elements are presented.
effective scattering area, retroreflexion, retroreflective reflective–refractive elemetns, laser radiation, radiation divergence
OCIS codes: 110.0110
References:1. A. V. Krasnyashchikh, “Development and research of an optoelectronic system for measuring the deformation of large engineering structures,” in Author’s abstract of dissertation for candidate of technical sciences, SPbGUITMO, St. Petersburg (2004).
2. M. A. Sadovnikov, “Accuracy of determining target’s center of mass measurement correction in high-precision satellite laser ranging,” Usp. Sovrem. Radioelektron. 8, 63–66 (2009).
3. M. A. Sadovnikov, A. L. Sokolov, and V. D. Shargorodskiı˘, “Analysis of the equivalent scattering surface scattering of corner reflectors with various surface coatings,” Usp. Sovrem. Radioelektron. 8, 55–62 (2009).
4. I. A. Medvedkov, N. I. Potapova, A. D. Tsvetkov, and O. Yu. Shkatov, “Retroreflective element for modeling the reflective characteristics of light, including laser radiation,” Russian patent 2349940 (2009).
5. A. D. Tsvetkov, “Catadioptric retroreflector, ” J. Opt. Technol. 78(3), 170–173 (2011) [Opt. Zh. 78(3), 21–25 (2011)].
6. A. D. Tsvetkov, “How the parameters of a catadioptric retroreflector affect the characteristics of its angular field,” J. Opt. Technol. 78(5), 294–297 (2011) [Opt. Zh. 78(5), 13–17 (2011)].
7. Yu. M. Klimkov, Fundamentals of the Calculation of Optoelectronic Devices with Lasers (Sovetskoe Radio, Moscow, 1978).
8. N. V. Baryshnikov and R. O. Stepanov, “Development of a method and instrumentation for measuring the retroreflective characteristics of optoelectronic infrared systems,” Izmer. Tekh. 9, 24–28 (2007).
9. V. O. Kobak, Radar Reflectors (Sovetskoe Radio, Moscow, 1975).