ITMO
ru/ ru

ISSN: 1023-5086

ru/

ISSN: 1023-5086

Scientific and technical

Opticheskii Zhurnal

A full-text English translation of the journal is published by Optica Publishing Group under the title “Journal of Optical Technology”

Article submission Подать статью
Больше информации Back

DOI: 10.17586/1023-5086-2021-88-07-57-64

УДК: 535.321, 535.32

Method for finding the optical constants of films from their reflection and transmission spectra

For Russian citation (Opticheskii Zhurnal):

Котликов Е.Н. Метод нахождения оптических констант пленок по спектрам отражения и пропускания // Оптический журнал. 2021. Т. 88. № 7. С. 57–64. http://doi.org/10.17586/1023-5086-2021-88-07-57-64

 

Kotlikov E.N. Method for finding the optical constants of films from their reflection and transmission spectra [in Russian] // Opticheskii Zhurnal. 2021. V. 88. № 7. P. 57–64. http://doi.org/10.17586/1023-5086-2021-88-07-57-64

For citation (Journal of Optical Technology):

E. N. Kotlikov, "Method for finding the optical constants of films from their reflection and transmission spectra," Journal of Optical Technology. 88(7), 391-396 (2021). https://doi.org/10.1364/JOT.88.000391

Abstract:

This paper presents an analysis of whether the optical constants of films can be determined from their transmission and reflection spectra. It is shown that such a problem cannot be unambiguously solved at separate points or on small sections of the spectrum, and ways are found to get around this difficulty. A spectrophotometric method is proposed for finding the optical constants of films, including correction of the spectra for absorption and the successive use of given sections of the spectrum. The optimum width of the sections of the spectrum is determined for finding an unambiguous solution. As an example, the given method is used to determine the optical constants of a CaY2F8 film in the 1.3–17 µm spectral region.

Keywords:

analysis, unambiguous solution, refractive indices, spectrophotometric method, transmission spectra, reflection spectra, correction

Acknowledgements:

The research was supported by the Ministry of science and higher education of RF, grant No. FSRF-2020-0004.

OCIS codes: 300.0300, 310.4165

References:

1. M. Born and E. Wolf, Principles of Optics: Electromagnetic Theory of Propagation, Interference, and Diffraction of Light (Pergamon Press, Oxford, 1965; Nauka, Moscow, 1970).
2. O. S. Heavens, “The measurement of the optical constants of thin films,” in The Physics of Thin Films: Advances in Research and Development, G. Hass and R. E. Thun, eds. (Academic, New York, 1964; Mir, Moscow, 1967), vol. 2, pp. 136–185.
3. B. V. Andrievski˘ı, V. F. Vakhulovich, and N. A. Romanyuk, “Determining the refractive-index dispersion and thickness of thin films from the reflection or transmission spectra,” Opt. Spectrosc. 65(1), 79–82 (1988) [Opt. Spektrosk. 65(1), 136–140 (1988)].
4. O. P. Konovalova and I. I. Shaganov, “Determining the optical constants of weakly absorbing dielectric layers on a transparent substrate,” Sov. J. Opt. Technol. 55, 489–491 (1988) [Opt. Mekh. Prom. 55(8), 39–41 (1988)].
5. A. N. Tropin, “Film-forming materials for thin-film optical coatings: new problems and prospects (Review),” Usp. Prikl. Fiz. 4(2), 206–211 (2016).
6. D. Poelman and P. F. Smet, “Methods for the determination of the optical constants of thin films from single transmission measurements: a critical review,” J. Phys. D: Appl. Phys. 36, 1850–1857 (2003).
7. J. A. Dobrowolski and A. Waldorf, “Determination of optical constants of thin-film coating materials based on inverse synthesis,” Appl. Opt. 22(20), 3191–3200 (1983).
8. F. P. Vasil’ev, Numerical Methods of Solving Extremal Problems (Nauka, Moscow, 1980).
9. E. N. Kotlikov and G. V. Tereshchenko, “The use of chalcogenide compounds for fabricating antireflection coatings in the mid-IR region,” J. Opt. Technol. 64(3), 264–268 (1997) [Opt. Zh. 64(3), 110–115 (1997)].
10. E. N. Kotlikov, A. N. Kotlikov, and E. V. Yurkovets, “Analysis of the spectra of optical films: modeling and situational quality control of complex systems,” in Collection of Reports of the Scientific Session of the GUAP (GUAP, St. Petersburg, 2016), pp. 247–252.
11. E. N. Kotlikov and E. V. Yurkovets, “Method of determining the optical constants of absorbing films: substrates with no absorption,” J. Opt. Technol. 85(1), 48–52 (2018) [Opt. Zh. 85(1), 59–64 (2018)].
12. E. N. Kotlikov, I. I. Kovalenko, and Yu. A. Novikova, “FilmMgr program for the synthesis and analysis of interference coatings,” Inf. Upr. Sist. 3(76), 51–59 (2015).
13. E. N. Kotlikov, “A spectrophotometric method for determination of the optical constants of materials,” J. Opt. Technol. 83(2), 77–80 (2016) [Opt. Zh. 83(2), 61–67 (2016)].
14. M. A. Okatov, Handbook for Technicians and Opticians (Politekhnika, St. Petersburg, 2004).
15. H. Qi, X. Zhang, M. Jiang, Q. Wang, and D. Li, “Optical constants of zinc selenide in visible and infrared spectral range,” J. Appl. Spectrosc. 84, 679–682 (2017) [Zh. Prikl. Spektrosk. 84, 660–663 (2017)].