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ISSN: 1023-5086

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ISSN: 1023-5086

Scientific and technical

Opticheskii Zhurnal

A full-text English translation of the journal is published by Optica Publishing Group under the title “Journal of Optical Technology”

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DOI: 10.17586/1023-5086-2022-89-10-51-57

УДК: 535.853, 535.323

Changes in optical thicknesses of Ge and SiO thin films and spectral characteristics of narrowband filters at cryogenic temperatures

For Russian citation (Opticheskii Zhurnal):

Гусев А.Г., Хасанов А.М., Нуруллин И.З., Кольцов А.Ю., Галиев А.Н., Гильфанов А.Р., Галиев Р.Р. Изменение оптических толщин тонких плёнок Ge, SiO и спектральных характеристик узкополосных фильтров при криогенных температурах // Оптический журнал. 2022. Т. 89. № 10. С. 51–57. http://doi.org/10.17586/1023-5086-2022-89-10-51-57

 

Gusev A.G., Khasanov A.M., Nurullin I.Z., Koltsov A.Yu., Galiev A.N., Gilfanov A.R., Galiev R.R. Changes in optical thicknesses of Ge and SiO thin films and spectral characteristics of narrowband filters at cryogenic temperatures [in Russian] // Opticheskii Zhurnal. 2022. V. 89. № 10. P. 51–57. http://doi.org/10.17586/1023-5086-2022-89-10-51-57

For citation (Journal of Optical Technology):

A. G. Gusev, A. M. Khasanov, I. Z. Nurullin, A. Yu. Kol’tsov, A. N. Galiev, A. R. Gil’fanov, and R. R. Galiev, "Changes in optical thicknesses of Ge and SiO thin films and spectral characteristics of narrowband filters at cryogenic temperatures," Journal of Optical Technology. 89(10), 595-599 (2022). https://doi.org/10.1364/JOT.89.000595

Abstract:

Subject of study. Two narrowband filters with Ge and SiO resonant layers were investigated both at room and cryogenic temperatures of 293 and 80 K, respectively. Aim of study. The deposition of bandpass filters with predefined deviations of optical thickness layers under operating conditions at cryogenic temperatures was considered. The presented design of an optical interference coating increases the transmission coefficient in the operating spectral ranges during its operation at cryogenic temperatures. Method. An antireflective bandpass coating constituting a pair of Ge-SiO film-forming materials was deposited onto a substrate made of an optical material using vacuum deposition. The layer thicknesses were controlled during their deposition using an optical control system. Main results. The obtained spectral characteristics of two narrowband filters are presented herein. The optical thicknesses of the filters with resonant layers made of Ge and SiO and thickness variations at the temperatures of 293 and 80 K were determined by an iteration method via the positions of the wavelengths of maximum transmission of the filters. Practical significance. The spectral characteristics of the filters with SiO resonant layers demonstrated smaller changes at cryogenic temperatures than those of the filters with Ge resonant layers.

Keywords:

Ge, SiO, optical thickness, spectral characteristics, cryogenic temperature, narrow-band interference filter, thin films

OCIS codes: 310.6860, 310.4165

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