Metal–dielectric bandpass interference filters

Publication in Journal of Optical Technology

For Russian citation (Opticheskii Zhurnal):

Котликов Е.Н. Металлодиэлектрические полосовые интерференционные фильтры // Оптический журнал. 2022. Т. 89. № 11. С. 70–75. http://doi.org/ 10.17586/1023-5086-2022-89-11-70-75

Kotlikov E.N. Metal–dielectric bandpass interference filters [in Russian] // Opticheskii Zhurnal. 2022. V. 89. № 11. P. 70–75. http://doi.org/ 10.17586/1023-5086-2022-89-11-70-75

For citation (Journal of Optical Technology):

E. N. Kotlikov, "Metal–dielectric bandpass interference filters," Journal of Optical Technology. 89(11), 687-690 (2022). https://doi.org/10.1364/JOT.89.000687

Abstract:

Subject of study. Metal–dielectric bandpass interference filters based on Al₂O₃, SiO, Ge, and Ni films were investigated. Aim of study. The aim of this study was to develop metal–dielectric interference filters for a mid-infrared spectral range based on transparent dielectric films and absorbing nickel films in which the long-wavelength component of the radiation spectrum is blocked. Method. A numerical–analytical method was used. The transmission spectrum of the original filter composed of dielectric films was calculated. A mirror coating consisting of quarter-wave films of Al₂O₃, SiO, Ge, and Ni transparent in the wavelength range of 2.2–6.0 µm was used. The absorption spectrum of the coating after the introduction of nickel films into Al₂O₃, SiO, and Ge films was calculated. The dependence of the absorption spectrum was determined for the cases of sequential nickel film introduction at all points of an individual film. The points with minimum absorptions were determined. The minimum absorption was obtained when an absorbing nickel film was introduced into the middle of the Ge film. The resulting structure was optimized for all thicknesses of the SiO, Ge, and Ni films. FilmManager software implementing two algorithms, the random iteration and Powell’s quadratic approximation algorithms, for finding the minimum of the quality function was used for optimization. The transmission spectra of the entire structure were obtained. Main results. A method for synthesizing a metal–dielectric bandpass filter was proposed. Several bandpass filters were synthesized, namely, filter 1 with a transmission maximum in the wavelength range of 2.2–4.6 µm and average transmission in the range of 6–15 µm not exceeding 0.6%, and filter 2 with a transmission maximum in the wavelength range of 2.9–5.9 µm and average transmission in the wavelength range of 6–15 µm not exceeding 0.2%. Practical significance. The bandpass interference filter proposed in this study can be implemented on a silicon substrate with high transmission in the range of 1–20 µm without additional blocking absorption or interference filters in the far-infrared range. This reduces the cost of such a filter, thus increasing its competitiveness.

Keywords:

band-pass interference filters, spectra, dielectric and metal films, absorption, transmission, infrared spectrum range

Acknowledgements:

The research was supported by the grant of the Ministry of science and higher education of RF No. FSFR-2020-0004.

OCIS codes: 250.0230, 310.1620

References:

1. M. A. Okatov, E. A. Antonov, A. Baigozhin, et al., Handbook of Optical Processing Engineers (Politekhnika, St. Petersburg, 2004).
2. M. Vollmer and K. P. Möllmann, Infrared Thermal Imaging: Fundamentals, Research and Applications (Wiley-VCH, Weinheim, 2017).
3. V. V. Tarasov and Yu. G. Yakushenkov, “Current state and development prospects of foreign thermal imaging systems,” Nauchno-tekh. Vestn. Inf. Tekhnol., Mekh. Opt. 3(85), 1–12 (2013).
4. A. Sklorz, S. Janssen, and W. Lang, “Detection limit improvement for NDIR ethylene gas detectors using passive approaches,” Sens. Actuators B 175, 246–254 (2012).
5. S. P. Varfolomeev, N. I. Gorbunov, L. K. Diikov, and F. K. Medvedev, “Sensors for fire and explosion safety systems,” Datchiki Sist. (6), 5–7 (2004).
6. D. S. Afanasiev, E. A. Bardakova, and D. S. Bystryakov, “Analytical review of volatile substance sensors for the Internet of Things,” Inf. Tekhnol. Telekommun. 4, 1–12 (2016).
7. H. A. Macleod, Thin Film Optical Filters (CRC Press, Tucson, 2010).
8. N. Ismail, C. C. Kores, D. Geskus, and M. Pollnau, “Fabry–Pérot resonator: spectral line shapes, generic and related Airy distributions, linewidths, finesses, and performance at low or frequency-dependent reflectivity,” Opt. Express 24, 16366–16389 (2016).
9. M. Born and E. Wolf, Fundamentals of Optics (Nauka, Moscow, 1970).
10. E. N. Kotlikov and J. A. Novikova, “Optical constants of silicon in the range of 30–10000 cm−1 ,” Opt. Spectrosc. 120(5), 815–817 (2016) [Opt. Spektrosk. 120(5), 165–168 (2016)].
11. A. N. Tropin, “Film-forming materials for thin-film optical coatings: new challenges and prospects (a review),” Usp. Prikl. Fiz. 4(2), 206–211 (2016).
12. P. Ma, F. Lin, and J. A. Dobrowolski, “Design and manufacture of metal/dielectric long-wavelength cutoff filters,” Appl. Opt. 50(9), C201–C209 (2011).
13. Optilayer, http://optilayer.com/.
14. A. V. Tikhonravov, “The method of needle variations is a universal method for designing optical coatings,” in Proceedings of the International Optical Congress “Optics–XXI Century” (2000), pp. 16–20.
15. D. T. Doi and L. A. Gubanova, “Interference metal–dielectric light filters,” Nauchno-tekh. Vestn. S.-Peterb. Gos. Univ. Inf. Tekhnol., Mekh. Opt. (5), 19–22 (2001).
16. E. N. Kotlikov, “Narrow band interference filters with absorbing films,” J. Opt. Technol. 88(6), 321–322 (2021) [Opt. Zh. 88(6), 45–47 (2021)].
17. E. N. Kotlikov, I. I. Kovalenko, and Yu. A. Novikova, “FilmManager software for synthesis and analysis of interference coatings,” Inf.-upr. Sist. 3(76), 51–59 (2015).
18. F. P. Vasiliev, Numerical Methods for Solving Extreme Problems (Nauka, Moscow, 1980).
19. V. M. Zolotarev, V. N. Morozov, and E. V. Smirnov, Optical Constants of Natural and Technical Media (Khimiya, Leningrad, 1984).