УДК: 621.373.826
Comparing thermal and electrical methods for controlling the wavelength of semiconductor-laser radiation
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Publication in Journal of Optical Technology
Ветров А.А., Данилов Д.А., Есипов С.С., Комиссаров С.С., Сергушичев А.Н. Сравнение температурных и электрических методов управления длиной волны излучения полупроводниковых лазеров // Оптический журнал. 2009. Т. 76. № 8. С. 90–96.
Vetrov A.A., Danilov D.A., Esipov S.S., Komissarov S.S., Sergushichev A.N. Comparing thermal and electrical methods for controlling the wavelength of semiconductor-laser radiation [in Russian] // Opticheskii Zhurnal. 2009. V. 76. № 8. P. 90–96.
A.A. Vetrov, D.A. Danilov, S.S. Esipov, S.S. Komissarov, and A.N. Sergushichev, "Comparing thermal and electrical methods for controlling the wavelength of semiconductor-laser radiation," Journal of Optical Technology. 76 (8), 520-525 (2009). https://doi.org/10.1364/JOT.76.000520
This paper presents the results of a study of the spectral characteristics of commercial semiconductor lasers, using an optical spectral analyzer and a supply-and-control unit for the laser. Families of spectral characteristics are obtained in a wide range of injection currents and temperatures. The temperature and current coefficients for the wavelength of the laser radiation are determined.
semiconductor laser, controlling the wavelength
OCIS codes: 140.5960, 140.3490, 140.3600
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