УДК: 535-4, 535.8

Ellipsometric studies of the natural oxide film on the surface of cadmium telluride

Publication in Journal of Optical Technology

For Russian citation (Opticheskii Zhurnal):

Одарич В.А., Евменова А.З., Сизов Ф.Ф. Эллипсометрические исследования природной оксидной пленки на поверхности теллурида кадмия // Оптический журнал. 2013. Т. 80. № 8. С. 63–69.

Odarich V. A., Evmenova A. Z., and Sizov F. F. Ellipsometric studies of the natural oxide film on the surface of cadmium telluride [in Russian] // Opticheskii Zhurnal. 2013. V. 80. № 8. Р. 63–69.

For citation (Journal of Optical Technology):

V. A. Odarich, A. Z. Evmenova, and F. F. Sizov, "Ellipsometric studies of the natural oxide film on the surface of cadmium telluride," Journal of Optical Technology. 80(8), 515-519 (2013). https://doi.org/10.1364/JOT.80.000515

Abstract:

It is established by ellipsometric measurements that the interaction process of a sheared surface of single-crystal cadmium telluride with atmospheric air has two stages. In the first 7–10 days, the character of the change of the measured ellipsometric parameters corresponds to the formation of an absorbing layer with a thickness of one or two monatomic layers. Beginning at 20 days, a transparent film appears, possibly an oxide, whose refractive index is close to 2.2, while the thickness increases to 5–6 nm in an oxidation time of up to 1 year. Starting from literature data, it is assumed that the inner film is a layer of free tellurium, while the outer film is formed by cadmium or tellurium oxides or a mixture of them.

Keywords:

ellipsometry, natural cadmium telluride oxide, thin film parameters

References:

1. M. Hage-Ali, R. Stuck, A. N. Saxena, and P. Siffert, “Investigation of CdTe surface by mass-spectroscopic, ellipsometric method,” Appl. Phys. 19, 25 (1979).

2. J. Fritsche, S. Gunst, E. Golusda, M. C. Lejard, A. Thiben, T. Mayer, A. Klein, R. Wendt, R. Gegenwart, D. Bonnet, and W. Jaegermann, “Surface analysis of CdTe thin-film solar cells,” Thin Solid Films 387, 161 (2001).

3. J. Kowalski, B. A. Orlowski, and J. Ghijsen, “Oxide formation on the CdTe(111)A (1×1) surface,” Appl. Surf. Sci. 166, 237 (2000).

4. M. Suita and T. Taguchi, “Thermal oxidation of CdTe surfaces and properties of MOS diodes,” Nucl. Instrum. Methods Phys. Res. A 283, 268 (1989).

5. G. A. Il’chuk, V. I. Ivanov-Omskiı˘, V. Yu. Rud’, Yu. V. Rud’, R. N. Bekimbetov, and N. A. Ukrainets, “Fabrication and photoelectric properties of oxide/CdTe structures,” Fiz. Tekh. Poluprovodn. 34, 1099 (2000) [Semiconductors 34, 1058 (2000)].

6. T. Aoki, V. A. Gnatyuk, V. A. Odarych, L. V. Poperenko, and O. O. Fedosenko, “CdTe samples properties by ellipsometric analysis,” in Proceedings of the Seventh International Conference on Global Research and Education in New Methods in Education, Pech, Hungary, 2008, pp. 468–474.

7. L. V. Poperenko, V. A. Gnatyuk, V. A. Odarych, and T. Aoki, “Ellipsometric study of the surface of CdTe (111) crystals,” in Proceedings of International Workshop on Field Emitter and Semiconductor Materials and Devices, Research Institute of Electronics, Shzuooka University, 2010, pp. 15–19.

8. A. Z. Evmenova and V. A. Odarich, “Elipsometrichni doslidzhennya prirodnoi okisnoi plivki na poverkhni skolu monokristalichnogo teluridu kadmiyu,” in Materiali elektronnoi tekhniki ta suchasni Informatsiı˘ni tekhnologii. Tretya mizhnarodna naukovo-praktichna konferentsiya, Kremenchuk, Ukraine, 2008, pp. 121–122.

9. A. Z. Evmenova and V. A. Odarich, “Osoblivosti formuvannya prirodnoi okisnoi plivki na teluridi kadmiyu,” in 12th International Conference on Physics and Technology of Thin Films and Nanosystems, Ivanofrankivsk, Ukraine, 2009, vol. 2, pp. 174–175.

10. V. A. Makara, V. A. Odarich, T. Yu. Kepich, T. D. Preobrazhenskaya, and O. V. Rudenko, “Device and methods for measuring the parameters and the degree of homogeneity of thin-film structures,” Tekhnol. Konstruir. Élektron. Appl. No. 3(81), 40 (2009).

11. A. Sadao, K. Toshifumi, and S. Norihiro, “Optical properties of CdTe: experiment and modeling,” J. Appl. Phys. 74, 3435 (1993).

12. A. Z. Evmenova, V. A. Odarych, F. F. Sizov, and M. V. Vuichyk, “Absorptive CdTe-films optical parameters and film thickness determination by ellipsometric method,” Opt. Appl. 38, 585 (2008).

13. D. N. Bose, S. Basu, and K. C. Mandal, “Characterization of chemically modified CdTe surfaces,” Thin Solid Films 164, 13 (1988).

14. E. D. Palik, ed., Handbook of Optical Constants of Solids (Academic, New York, 1991).

15. R. Miotto, F. D. Kiss, and A. C. Ferraz, “Oxygen adsorption on CdTe (111),” Surf. Sci. 525, 24 (2003).

16. F. D. Kiss and A. C. Ferraz, “The oxidation mechanism of CdTe (111) surface,” Braz. J. Phys. 36, 291 (2006).

17. Physical and Chemical Properties of Oxides. A Handbook (Metallurgiya, Moscow, 1978).

18. A. E. Vol and I. K. Kagan, Structure and Properties of Binary Metallic Systems (Nauka, Moscow, 1979), vol. 4.

19. K. Arshak and O. Korostynska, “Gamma radiation dosimetry using tellurium dioxide thin films structures,” Sensors 2, 347 (2002).

20. C. Dantus, G. G. Rusu, M. Dobromir, and M. Rusu, “Preparation and characterization of CdO thin films obtained by thermal oxidation of evaporated Cd thin films,” Appl. Surf. Sci. 255, 2665 (2008).

21. S. G. Choi, J. Zuñiga-Pérez, V. Muñoz-Sanjosé, A. G. Norman, C. L. Perkins, and D. H. Levi, “Complex dielectric function and refractive index spectra of epitaxial CdO thin film grown on r-plane sapphire from 0.74 to 6.45 eV,” J. Vac. Sci. Technol. B 28, 1120 (2010).