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ISSN: 1023-5086

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ISSN: 1023-5086

Scientific and technical

Opticheskii Zhurnal

A full-text English translation of the journal is published by Optica Publishing Group under the title “Journal of Optical Technology”

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УДК: 621.372.8

Optimizing the mode-excitation conditions when a planar waveguide is being investigated by means of end-fire mode spectroscopy

For Russian citation (Opticheskii Zhurnal):

Свистунов Д.В. Оптимизация условий возбуждения мод при исследовании планарного волновода методом торцевой модовой спектроскопии // Оптический журнал. 2014. Т. 81. № 1. С. 3–9.

 

Svistunov D.V. Optimizing the mode-excitation conditions when a planar waveguide is being investigated by means of end-fire mode spectroscopy [in Russian] // Opticheskii Zhurnal. 2014. V. 81. № 1. P. 3–9.

For citation (Journal of Optical Technology):

D. V. Svistunov, "Optimizing the mode-excitation conditions when a planar waveguide is being investigated by means of end-fire mode spectroscopy," Journal of Optical Technology. 81(1), 1-5 (2014). https://doi.org/10.1364/JOT.81.000001

Abstract:

An analysis of the optical measurement layout is used to determine the main factors that affect the reliability of the results of measuring the spectrum of waveguide modes by end-fire mode spectroscopy. It is shown that these factors characterize how much the conditions of end-fire excitation of the waveguide modes deviate from the optimum regime. An estimate is made of the acceptable limits by which the adjustment parameters of the module for introducing light into the waveguide can deviate from the optimum values, and a technique is proposed for adjusting this part of the optical layout.

Keywords:

planar waveguide, spectrum of modes, end-fire mode spectroscopy

OCIS codes: 230.7390, 130.0130, 160.3130, 120.3940

References:

1. T. Tamir, ed., Integrated Optics (Mir, Moscow, 1978).
2. D. V. Svistunov, “End-fire mode spectroscopy technique of examination of planar waveguides,” J. Opt. A 10, 085301 (2008).
3. D. V. Svistunov, “New measuring method of examination of planar optical waveguides,” PIERS Online 5, No. 4, 316 (2009).
4. J. M. White and P. F. Heidrich, “Optical-waveguide refractive-index profiles determined from measurement of mode indices: a simple analysis,” Appl. Opt. 15, 151 (1976).