Ways to improve the industry-wide system for metrological assurance of infrared optoelectronic devices

Балоев В.А., Курт В.И., Щипунов А.Н. Направления совершенствования отраслевой системы метрологического обеспечения инфракрасных оптико-электронных приборов // Оптический журнал. 2007. Т. 74. № 3. С. 5–12.

Baloev V.A., Kurt V.I., Shchipunov A.N. Ways to improve the industry-wide system for metrological assurance of infrared optoelectronic devices [in Russian] // Opticheskii Zhurnal. 2007. V. 74. № 3. P. 5–12.

V. A. Baloev, V. I. Kurt, and A. N. Shchipunov, "Ways to improve the industry-wide system for metrological assurance of infrared optoelectronic devices," Journal of Optical Technology. 74 (3), 152-158 (2007). https://doi.org/10.1364/JOT.74.000152

This paper discusses problems of the metrological assurance of the production, testing, and operation of IR optoelectronic devices and proposes ways to improve systems for the metrological assurance of IR optoelectronic devices.