Multispectral measurement complexes and their metrological assurance

Дмитриев Е.И., Пудиков А.В., Сакян А.С., Сидоровский Н.В., Старченко А.Н., Филиппов В.Г. Многоспектральные измерительные комплексы и их метрологическое обеспечение // Оптический журнал. 2010. Т. 77. № 3. С. 44–50.

Dmitriev E.I., Pudikov A.V., Sakyan A.S., Sidorovskiy N.V., Starchenko A.N., Filippov V.G. Multispectral measurement complexes and their metrological assurance [in Russian] // Opticheskii Zhurnal. 2010. V. 77. № 3. P. 44–50.

E. I. Dmitriev, A. V. Pudikov, A. S. Sakyan, N. V. Sidorovskiĭ, A. N. Starchenko, and V. G. Filippov, "Multispectral measurement complexes and their metrological assurance," Journal of Optical Technology. 77(3), 188-193 (2010). https://doi.org/10.1364/JOT.77.000188

Examples are used to show the development trends of optoelectronic complexes for the diagnosis and certification of continuous-spectrum radiation sources under laboratory, shop, and field conditions. Questions of the metrological assurance of the measurements are considered.