Digital microscopy from nano to macro, using the SIAMS image-analysis system

Кадушников Р.М., Алиевский В.М., Сомина С.В., Козерчук А.Л., Петров М.С. Цифровая микроскопия от нано до макро с использованием системы анализа изображений SIAMS // Оптический журнал. 2011. Т. 78. № 1. С. 77–82.

Kadushnikov R.M., Alievskiy V.M., Somina S.V., Kozerchuk A.L., Petrov M.S. Digital microscopy from nano to macro, using the SIAMS image-analysis system [in Russian] // Opticheskii Zhurnal. 2011. V. 78. № 1. P. 77–82.

R. M. Kadushnikov, V. M. Alievskiĭ, S. V. Somina, A. L. Kozerchuk, and M. S. Petrov, "Digital microscopy from nano to macro, using the SIAMS image-analysis system," Journal of Optical Technology. 78(1), 61-65 (2011). https://doi.org/10.1364/JOT.78.000061

This article discusses the key features of new image-analysis systems, based on electronic-table technology for working with images. It is shown that image-analysis systems can be transformed from the category of visualization systems into the category of measurement facilities. Examples are given of the operation of the SIAMS image analyzer for analyzing the images of microstructures in a wide range of scales, obtained by various methods of digital microscopy.