Opticheskii Zhurnal. 2012. V. 79. № 3.
Production editor’s foreword
Baloev, V.A.
Optoelectronic and optical instrumentation in SPA "State Institute of Applied Optics"Optical instrumentation and technology
Ivanov V.P., Ovsyannikov, V.A., Filippov, V.L.
A method of optimizing nonscanning thermal viewersBaloev, V.A., Belyakov, Y.M., Karpov, A.I., Krenev, V.A., Molin, D.A., Matveev, A.G., Yatsyk, V.S.
Modelling the mirror-control system in a Cardan suspension for airborne search-and-scanning systemsBaloev, V.A., Mishanin, S.S., Ovsyannikov, V.A., Filippov, V.L., Yakubson, S.E., Yatsyk, V.S.
Analysis of ways to enhance the efficiency of ground-based optoelectronic observation complexesGabrakhmanov, T.R., Yatsyk, V.S.
Optimizing the parameters of staring–scanning optoelectronic systems for detecting small high-temperature objects with variable radiation intensityPavlycheva, N.К., Khasan, M.
Increasing the reliability of an expert estimate of the probability of detecting and recognizing objects from thermal-vision imagesDemin, A.D., Chugunov, Y.P.
Multichannel photoelectric systems for recording line spectraBaloev, V.A., Ivanov V.P., Larionov, N.P., Lukin, A.V., Melnikov, A.N., Skochilov, A.F., Uraskin, A.M., Chugunov, Y.P.
A precise method of monitoring the alignment of two-mirror telescopes, based on a system of synthesized annular hologramsPhysical optics
Ovsyannikov, V.A., Ovsyannikov, Y.V., Filippov, V.L.
Increasing the reliability of an expert estimate of the probability of detecting and recognizing objects from thermal-vision imagesOvsyannikov, V.A., Filippov, V.L.
Technique for estimating the efficiency of thermal viewers when objects are observed through aerosol formationsTiranov, A.D., Filippov, V.L.
Calculating the spectral density of the radiant intensity of the plumes of solid-fuel rocket enginesOptical material science and technology
Abrakhmanov, R.K., Znamenskiy, M.Y., Lukashevich, Y.K.
Obtaining ruled diffraction gratings with a nonrectangular ruled zoneNesmelova, I.M., Astaf’ev, N.I., Kulakova, N.A.
The optical properties of single-crystal silicon in the 3–5-µm region