Opticheskii Zhurnal. 2013. V. 80. № 5.
Physical optics
Vashchenko, E.V., Gladskikh, I.A., Przhibelskiy, S.G., Khromov, V.V., Vartanyan, T.A.
Conductivity and photoconductivity of granular silver films on a sapphire substrateStumpf, S.A., Kozlov, S.A., Korolev, A.A.
Strong-field dynamics of a light pulse composed of a small number of vibrations when plasma is excited in a dielectric mediumCalculation, design and manufacture of optical systems
Bakholdin, A.V., Vasiliev, V.N., Grimm, V.A., Romanova, G.E., Smirnov, S.A.
Virtual-display optical devicesBakholdin, A.V., Vasiliev, V.N., Grimm, V.A., Romanova, G.E., Smirnov, S.A.
Using prism elements to construct flat waveguide screensBayova, Y.V., Lapovok, E.V., Khankov, S.I.
Analytical technique for calculating the heat fluxes in near-earth space that form the thermal regime of space telescopesGurevich, E.S., Tochitskiy, Y.I., Tsuran, V.I.
Optical instrumentation for microelectronicsEvtikhiev, N.N., Krasnov, V.V., Starikov, S.N.
A method of generating amplitude masks with a constant power spectra and using them to measure the two-dimensional modulation-transfer functions of optical systemsHolography
Evtikhiev, N.N., Starikov, S.N., Cheremkhin, P.А.
Estimating how the dynamic range and noise of the recording cameras affect the quality of digital hologramsOptical instrument making and metrology
Demidov, V.V., Dukelskiy, K.V., Ter-Nersesyants, E.V., Shevandin, V.S.
Investigation of the single-mode operating regime of microstructured lightguides with radiation-leakage channelsPavlov, N.I., Prilipko, А.Y.
Rapid survey of a circular zone using an IR scanning system with a photodetector arrayVishnyakov, G.N., Levin, G.G., Minaev, V.L., Tselmina, I.Y.
Phase-shifting interferometer for monitoring flat and spherical optical componentsOptical material science and technology
Arbuzov, V.I., Fedorov, Y.K., Kramarev, S.I., Shashkin, A.V.
How process factors affect the limiting characteristics of neodymium phosphate glasses for large disk- and rod-shaped active elementsRodin, S.A., Balabanov, S.S., Gavrishchuk, E.M., Eremeykin, O.N.
Using a Tm:YLF laser to determine the diffusion coefficient of chromium in ZnSeTao, Qing, Luo, F., Zhang, Jinxing, Mo, Bingcheng, Zhong, Rui, Miao, Dandan, Pan, Xiaoxing, Liang, Qianliang
Analysis of fabrication tolerance based on uneven thickness of Su8-photo-resist