Opticheskii Zhurnal. 2020. V. 87. № 1.
Physical optics
Makin, R.S., Makin, V.S.
The universal character of the breakdown of condensed media by powerful terahertz radiation and the Abbe criterionBorisova, M.E., Kamalov, A.M., Kiesewetter, D.V., Malyugin, V.I., Seleznev, D.A.
Estimation of single-walled carbon nanotube concentration in polyethylene using the spectral correlation methodLaser physics and technique
Zhevlakov, A.P., Bespalov, V.G., Danilov, O.B., Zaviyalov, A.K., Iliyinskiy, A.A., Kashcheev, S.V., Konopelko, L.A., Mak, A.A., Grishkanich, A.S., Elizarov, V.V.
Raman hyperspectral technologies for remote probing of hydrocarbon geochemical fieldsIzyneev, A.A., Sadovskiy, P.I.
Heat dissipation in an erbium active element based on phosphate glass with diode-laser pumpingHolography
Zharkova, G.M., Streltsov, S.A.
Effect of yttrium oxide nanoparticles on the dielectric properties and dynamics of the formation of holographic polymer–liquid-crystal compositesOptical instrument making and metrology
Demiyanenko, M.A., Kozlov, A.I., Novoselov, A.R., Ovsyuk, V.N.
Using the noise-equivalent temperature difference to compare superlarge photoreceivers based on quantum-well multilayer structuresKaraseva, E.A.
Development of a hardware-software measurement system for the collection, detection, and processing of photoplethysmogramsJia, Xiaopeng, Li, Zhiquan, Li, Qiang, Li, Wenchao, Tong, Kai, Wu, Xiaogang
Sucrose concentration sensor based on MoS2 nano-film and Au nanowires array enhanced surface plasmon resonance with graphene oxide nanosheetOptical material science and technology
Kotlikov, E.N., Tropin, A.N.
Optical and structural properties of ZnS0.5Se0.5 films and interference filters based on themGalutskiy, V.V., Ivashko, S.S.
Temperature dispersions of refractive indices and absorption coefficients of KNbO3 and LiNbO3 crystals in the THz frequency rangeBiomedical optics
Bondarko, V.M., Solnushkin, S.D., Chikhman, V.N.
Anomaly of the perception of the length of sloped linesSharing experiences
Kachalov, V.V., Mendeleev, V.Y.
Method of measuring the radiation power of a material and the corresponding blackbody model to determine its normal emissivity