Measuring the refractive index of an inhomogeneous antireflection coating

Немкова А.А., Путилин Э.С. Измерение показателя преломления неоднородного просветляющего покрытия // Оптический журнал. 2009. Т. 76. № 1. С. 61–63.

Nemkova A.A., Putilin E.S. Measuring the refractive index of an inhomogeneous antireflection coating [in Russian] // Opticheskii Zhurnal. 2009. V. 76. № 1. P. 61–63.

A. A. Nemkova and É. S. Putilin, "Measuring the refractive index of an inhomogeneous antireflection coating," Journal of Optical Technology. 76 (1), 51-52 (2009). https://doi.org/10.1364/JOT.76.000051

Ellipsometric and photometric methods are used to measure the refractive index of a film based on tetraethoxy silane. It is shown that the method of ellipsometry makes it possible not only to determine the refractive index but also to detect the inhomogeneity of the optical profile.