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ISSN: 1023-5086


ISSN: 1023-5086

Scientific and technical

Opticheskii Zhurnal

A full-text English translation of the journal is published by Optica Publishing Group under the title “Journal of Optical Technology”

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DOI: 10.17586/1023-5086-2024-91-04-123-134

УДК: 543.45; 535.41; 532.64, 536.24

Optical methods for measuring the thickness of thin evaporating liquid films

For Russian citation (Opticheskii Zhurnal):

Гатапова Е.Я., Пещенюк Ю.А. Оптические методы для измерения толщин тонких испаряющихся плёнок жидкости // Оптический журнал. 2024. Т. 91. № 4. С. 123–134.


Gatapova E.Ya., Peschenyuk Y.A. Optical methods for measuring the thickness of thin evaporating liquid films [In Russian] // Opticheskii Zhurnal. 2024. V. 91. № 4. P. 123–134.

For citation (Journal of Optical Technology):

The subject of study is evaporation characteristics, surface deformations, ruptures, thicknesses of droplets and thin films of liquid evaporating on heated surfaces by optical methods. The problem is relevant to the design of cooling systems for microelectronic devices based on the intense evaporation of thin liquid films. The aim of the work is measurement of thickness of thin liquid films from less than 20 microns to tens of nanometers using non-contact methods, and analysis of changes in the rate of evaporation from the surface of a drop and a thin film of liquid. Method. The results of thin liquid film thickness measurements applying two optical techniques are presented: the image analyzing interference method and the Schlieren method with a gradient filter. Main results. The quantitative data on the intensity of thin droplet evaporation on heated surfaces were obtained for volatile and non-volatile liquids. Interferometry with image analysis was used to measure the liquid film thicknesses down to 40 nm and to measure the dynamic contact angle of evaporating thin liquid droplet. The Schlieren method with a stepped filter was applied to measure the liquid film thickness on black silicon. The use of a substrate that absorbs light in the visible range allowed us to measure the thickness of liquid films down to 2 microns. From the surface tilt angles the thickness, surface area and volume of the droplet were reconstructed to analyze the evaporation intensity. Practical significance. The two optical methods for measuring the thin liquid films thickness presented in this work allow us to determine the thickness in dynamics and characterize multiple dry spots occurring during the intense evaporation and heating. These methods can be applied for measuring the receding contact angle.


interference method, Schlieren method, gradient filter, black silicon, thin liquid film, evaporation

this research was supported by the Russian Science Foundation, project № 20-19-00722, Characterization of the wetting properties of the black silicon surface was carried out through a state contract with IT SB RAS (121031800213-0) on the KRUSS DSA-100E device of the Unique scientific installation "TGD complex IT SB RAS" of the Institute of Thermophysics SB RAS

OCIS codes: 110.3175, 120.3180, 100.2960, 100.3175, 100.6890, 120.5700, 110.0180, 110.2650, 110.1650, 180.3170

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