Ellipsometry of standard and reduced graphene oxide thin films

Ilyin M.E., Toikka, A.S., Vorobev M.G., Kamanina, N.V.

For Russian citation (Opticheskii Zhurnal):

Ильин М.Е., Тойкка А.С., Воробьев М.Г., Каманина Н.В. Эллипсометрия тонких плёнок стандартного и восстановленного оксида графена // Оптический журнал. 2026. Т. 93. № 2. С. 88–95. http://doi.org/10.17586/1023-5086-2026-93-02-88-95

Ilin M.E., Toikka A.S., Vorobev M.G., Kamanina N.V. Ellipsometry of standard and reduced graphene oxide thin films [in Russian] // Opticheskii Zhurnal. 2026. V. 93. № 2. P. 88–95. http://doi.org/10.17586/1023-5086-2026-93-02-88-95

For citation (Journal of Optical Technology):

Abstract:

Subject of study. Standard and reduced graphene oxide films. Aim of study. Dependence estimation of optical and morphological parameters of films on the state (standard or reduced) of graphene oxide films by the ellipsometry method. Method. Measurement of polarization vectors components and finding polarization angles y and D, allowing to determine extinction coefficients k and refraction coefficients n, to estimate thickness and surface roughness of the investigated films. Main results. For the standard and reduced graphene oxide films, the dispersion dependences of the parameters n and k in the visible range were determined, the thickness and roughness of the films were found, and the thickness and roughness of the graphene oxide film were found to decrease upon reduction process. Practical significance. The results of ellipsometry of thin films of standard and reconstituted graphene oxide obtained in this work allow to use standard films as illuminating coatings due to relatively low refractive index, and reconstituted films as reflecting and absorbing electrical contacts due to increased (n up to 2.6) refractive index and extinction (k up to 1.3). In addition, the proposed method can be used to determine the degree of material reducing.

Keywords:

ellipsometry, graphene oxide, thermal reduction, spin-coating, thin films

Acknowledgements:

the work of Ilin M.E., Toikka A.S., Kamanina N.V. in the field of using thin-film polarizers for the functioning of LCD cells with investigated graphene oxide layers, supported by the Russian Science Foundation, Project № 24-23-00021 (https://rscf.ru/project/24-23-00021/). The work of Vorobyov M.G. was performed within the framework of the state assignment of the Ministry of Science and Higher Education of the Russian Federation at Institute of Problems of Mechanical Engineering. The founder’s number is № FFNF-2021-0001. Registration number of the topic: 121112500383-9 and the research was carried out using the equipment of UNU ‘Physics, Chemistry and Mechanics of Crystals and Thin Films’ Institute of Problems of Mechanical Engineering (St. Petersburg).

OCIS codes: 060.5530, 050.1590, 060.5625

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