A technique for forming a dynamic defect table of the thermal imaging matrix of the photodetector

For Russian citation (Opticheskii Zhurnal):

Гладков Р.А., Турбин А.В. Способ формирования динамической таблицы дефектов тепловизионной матрицы фотоприемного устройства // Оптический журнал. 2026. Т. 93. № 7. С. 10–20. DOI: 10.17586/1023-5086-2026-93-07-10-20

Gladkov R.A., Turbin A.V. A technique for forming a dynamic defect table of the thermal imaging matrix of the photodetector [in Russian] // Opticheskii Zhurnal. 2026. V. 93. № 7. P. 10–20. DOI: 10.17586/1023-5086-2026-93-07-10-20

For citation (Journal of Optical Technology):

Abstract:

Subject of study. Methods for processing thermal imaging images containing pulse interference caused by defects in the receiver matrix or electromagnetic interference. Aim of study. Development and experimental study of a frequency technique for generating a dynamic table of defects for their compensation in real time. Technique. A technique based on image transformation into the frequency domain using the Fourier transform is proposed. A filter with a steep transfer function is used to isolate high-frequency harmonics associated with pulse interference. After the inverse Fourier transform, the resulting high-frequency frame is analyzed, and based on the application of threshold conditions to the spatial distribution of brightness, a binary map of defective pixels is formed. This map is used to interpolate the values of defective pixels in the next frame. Main results. It has been experimentally confirmed that the technique effectively suppresses pulse interference, introducing minimal distortion into the useful signal. It has been experimentally shown that the method makes it possible to increase the peak signal-to-noise ratio to 33 dB. Practical significance. A new algorithm is proposed, the main advantage of which is the ability to work with a single frame in real time, which allows you to quickly update the defect table, adapting to the appearance of new “floating” matrix defects.

Keywords:

image processing, pulse interference, frequency method, thermal imaging, table of defective elements

OCIS codes: 100.0100, 110.3000, 070.0070

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