Opticheskii Zhurnal. 2003. V. 70. № 1.

Physical optics

Voznesenskii, N.B., Zolotarev V.M., Kalinichev, K.Y., Voronin, Y.M.

Scalar modelling of light propagation in multiwaveguide structures

Kozhukhov, S.S., Zolotarev V.M.

Modelling the optical properties of composite structures based on anisotropic fibers

Belyakov, A.V., Gurov, I.P.

Analyzing interference fringes by the wavelet method

Zhukova, E.V., Shishatskaya L.P.

Study of the absorption of metallic colloidal particles in the surface layer of a LiF

Volchek B.Z., Volchek B.Z., Vlasova E.N., Mamedov R.K., Mikhalev К.А.

Study of microporous membranes using frustrated total internal reflection spectroscopy

Malinin, I.V., Mamedov R.K., Volchek B.Z.

Effect of surface relief on the spectral characteristics of an object

Buslov, D.K., Sushko, N.I., Yukhnevich G.V.

The IR spectrum of liquid hydrogen fluoride

Buslov, D.K., Sushko, N.I., Yukhnevich G.V.

Measuring the thickness of thin separable sample cells

Laser physics and technique

Voznesenskii, N.B., Veiko, V.P., Voznesenskaya, N.N., Voronin, Y.M.

Mathematical model of the transmission of light in optical-fiber laser microinstruments

Fofanov, Y.A., Sokolov, I.V.

Sub-Poissonian single-mode lasing in a semiconductor laser with an external cavity

Veiko, V.P., Kalachev, A.I., Kaporskií L.N.

Measuring the temperature of a quartz fiber by two-wave pyrometry during the drawing

Optical instrumentation and technology

Mukhin E.Е., Razdobarin G.T., Semenov V.V., Tolstyakov S.Y., Shil'nikov A.N., Bakh L.I., Kochergin М.М., Mikhailovskii Y.K.

Multichannel diffraction spectrometer with a low scattered-light level

Vangonen, A.I., Gavrilov A.A., Robachevskii M.V., Taganov, O.K.

Possibilities of the MFTIR technique for monitoring the concentration of heavy water

Kartasheva, M.A., Maleshin M.N., Danilenkov V.I., Gerasimov V.S.

Atmospheric- and low-pressure inductively coupled plasma as an ion source for a mass

Belen’kii B.G., Kozulin R.A., Kurochkin V.E., Zolotarev V.M.

Analytical method of sequencing DNA using spectral fluorescence markers

Optical material science and technology

Shikhaleeva M.S., Stolyarova V.L.

Study of the refractive-index variation of glasses in the В2О3-SiO2 system during

Letters to the editor

Optical method of measuring the thickness of a transparent plate with a scattering

Information

-